ВЛАСНІ ТА ВЗАЄМНІ ПАРАЗИТНІ ПАРАМЕТРИ ЕЛЕМЕНТІВ ПРОТИЗАВАДНИХ ФІЛЬТРІВ ДЛЯ ДЖЕРЕЛ ЕЛЕКТРОЖИВЛЕННЯ КЛЮЧОВОГО ТИПУ

V/K/ Gurin; V.O. Pavlovsky; O.M. Yurchenko

No. 2 (2012), Information Measuring Systems in Electric Power Engineering

No. 2 (2012)

Information Measuring Systems in Electric Power Engineering

SELF-PARASITIC AND MUTUAL PARASITIC PARAMETERS IN POWER LINE FILTERS FOR SWITCHING MODE POWER SUPPLIES

Published 2012-02-02

V/K/ Gurin⁺⁻
V.O. Pavlovsky⁺⁻
O.M. Yurchenko⁺⁻

V/K/ Gurin

Institute of Electrodynamics of the National Academy of Sciences of Ukraine, pr. Peremohy, 56, Kyiv, 03057, Ukraine

V.O. Pavlovsky

Institute of Electrodynamics of the National Academy of Sciences of Ukraine, pr. Peremohy, 56, Kyiv, 03057, Ukraine

O.M. Yurchenko

Institute of Electrodynamics of the National Academy of Sciences of Ukraine, pr. Peremohy, 56, Kyiv, 03057, Ukraine

ARTICLE_57_PDF (Українська)

Keywords

EMI filters
self- parasitics
mutual parasitics
EPC
ESL протизавадний фільтр
паразитна ємність обмотки
паразитна індуктивність виводів конденсатора

How to Cite

[1]

Гурін, В., Павловський, В. and Юрченко, О. 2012. SELF-PARASITIC AND MUTUAL PARASITIC PARAMETERS IN POWER LINE FILTERS FOR SWITCHING MODE POWER SUPPLIES. Tekhnichna Elektrodynamika. 2 (Feb. 2012), 119.

Abstract

It is showed that there are two types of parasitic parameters in circuits of power line filters: self-parasitics and mutualparasitics. It is showed the basic essence of those parameters and their influence on filters’ insertion loss. References 3,figures 3.

ARTICLE_57_PDF (Українська)

References

Zeveke G.V., Ionkin P.A., Netushil A.V., Strahov S.V. Basics of circuit’s theory. Moskva: Energoatomizdat, 1989. 528 p.(Rus.)

Bessonov L.A. Theoretical Basics of Electrotechnics: Electrical Circuits. Moskva: Vysshaia shkola, 1978. 528 p.(Rus.)

Wang S., R.Chen R., Van Wyk J.D., Fred.C.Lee, Odentaal W.G. Developing Parasitic Cancellation Technologies to Improve EMI Filter Performance for Switching Mode Power Supplies // IEEE Transactions on Electromagnetic Compatibility. 2005. Vol. 47. No.4. Pp. 921-929.