DETERMINING PARAMETERS OF PULSE SEQUENCE FOR ADAPTIVE METHOD OF SEMICONDUCTOR DEVICES CURRENT-VOLTAGE CHARACTERISTICS MEASURING
ARTICLE_61_PDF (Українська)

Keywords

semiconductor device
thermal model
current-voltage characteristic
adaptive pulse measurement method полупроводниковый прибор
тепловая модель
вольт-амперная характеристика
, адаптивный импульсный способ измерения

How to Cite

[1]
Yermolenko, Y. et al. 2012. DETERMINING PARAMETERS OF PULSE SEQUENCE FOR ADAPTIVE METHOD OF SEMICONDUCTOR DEVICES CURRENT-VOLTAGE CHARACTERISTICS MEASURING. Tekhnichna Elektrodynamika. 3 (Apr. 2012), 127.

Abstract

To implement the adaptive pulse method for measuring the current-voltage characteristics of semiconductor devices the mathematical relation between the duration of pauses that follow the measuring pulses and the power and duration of these pulses is obtained. The use of obtained mathematical formula for specifying parameters of pulse sequence allows to reduce the accumulation of heat in the structure of semiconductor device during the process of measuring the current-voltage characteristics, thereby improving measuring accuracy. References 2, figures 2.

ARTICLE_61_PDF (Українська)

References

Bondarenko A.F., Yermolenko Ye.A. The method of automatic measurement of current-voltage characteristics of semiconductor devices // Tekhnichna elektrodynamika. Tematychnyi vypusk "Problemy suchasnoi elektrotekhniky". - 2010. - Vol. 2.-Pp. 126-129. (Rus)

Davidov P.D. Analysis and calculation of thermal modes of semiconductor devices. — Moskva: Enerhiia. 1967. - 144 p. (Rus)

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