Abstract
To implement the adaptive pulse method for measuring the current-voltage characteristics of semiconductor devices the mathematical relation between the duration of pauses that follow the measuring pulses and the power and duration of these pulses is obtained. The use of obtained mathematical formula for specifying parameters of pulse sequence allows to reduce the accumulation of heat in the structure of semiconductor device during the process of measuring the current-voltage characteristics, thereby improving measuring accuracy. References 2, figures 2.
References
Bondarenko A.F., Yermolenko Ye.A. The method of automatic measurement of current-voltage characteristics of semiconductor devices // Tekhnichna elektrodynamika. Tematychnyi vypusk "Problemy suchasnoi elektrotekhniky". - 2010. - Vol. 2.-Pp. 126-129. (Rus)
Davidov P.D. Analysis and calculation of thermal modes of semiconductor devices. — Moskva: Enerhiia. 1967. - 144 p. (Rus)

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