Keywords
surface charge
dielectric medium
conducting inclusions
intensity
tensed volume электрическое поле
поверхностный заряд
диэлектрическая среда
проводящие включения
напряженность
напряженный объем
How to Cite
Abstract
The mathematic model for numerical analysis of external low frequency electric field (EF) disturbance in the dielectric gap between two closely located conducting inclusions, which are placed along the field on a distance less than its sizes, is developed. It is shown that at decreasing of gap between surfaces such inclusions the field intensity inside this gap increases according to the law of power function. Also it is revealed that for fixed sizes conducting inclusions, which located in the line of field, the degree of field intensity in a dielectric gap raises at decreasing of distance between them and with increasing its surfaces curvature. The performed calculations corroborated that at approaching of cylindrical, spherical and ellipsoidal inclusions the degree of field intensity between the last-named is largest, and between the first-named is lowest. References 8, figures 5.
References
Demirchian K.S., Neiman L.R., Korovkin N.V, Chechurin V.L. Theoretical grounds of electrical engineering. Vol. 3. - Sankt Peterburg: Piter, 2003. - 377 p. (Rus.)
Landau L.D., Lifshits E.M. Electrodynamics of continuum. - Moskva: Nauka, 1980. - 560 p. (Rus.)
Nikolskii V.V. Electromagnetic field theory. - Moskva: Vysshaia slikola, 1964. - 384 p. (Rus.)
Technique and electrophysics of high voltage / Za redaktsieiu V.O. Brzhezickogo ta V.M. Mikhailova. - Kharkiv: Tornado, 2005.-930 p. (Ukr.)
Shidlovskii A.K., Shcherba A.A., Zolotarev V.M., Peretiatko Yu.V. Analysis of electric field microinhomogenety as a factor of threshold electrophysical processes intensity increasing in polymeric insulation of high voltage cables and self-bearing insulated wires // Tekhnichna elektrodynamika. - 2008. - № 4. - P. 3-14. (Rus.)
Shcherba M.A. Lows of local tensed volume changing in dielectric with distance changing between conducting microinclusions of different configurations. // Dopovidi za materialamy ISTC "Suchasni problemy elektroenergotekhniky ta avtomatyky". - Kyiv: Politekhnika, 2010. - Pp. 254 - 257. (Rus.)
Shcherba A.A., Shcherba M.A. Modeling and analysis of electric field in dielectric medium, disturbed by conducting microinclusions of different sizes and forms // Tekhnichna elektrodynamika. - 2009. - № 6. - C. 3-9.
Comsol Multiphysics 3.5. User’s Guide and introduction. — Comsol. Inc. - www.comsol.com
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